SXR Specifications
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SXR Scientific Capabilities
| Scientific Application | Time-resolved spectroscopy and scattering with ultrafast and ultraintense soft X-rays at the LCLS |
|---|---|
| Techniques | X-ray Emission Spectroscopy (XES) |
| X-ray Photoelectron Spectroscopy (XPS) | |
| X-ray Absorption Spectroscopy (XAS) | |
| Coherent Imaging and Fourier Transform Holography | |
| Reflectivity via Pump-Probe techniques | |
| Diffraction | |
| Resonant Inelastic X-ray Scattering (RIXS) | |
| Sample Environment | A wide range of experimental setups in UHV and HV conditions including liquid or highly ionized plasmas |
Source Parameters
| Repetition Rate | 1 Hz, 10 Hz, 30 Hz, 60 Hz and 120 Hz, Burst Mode or Single Shot | |||
|---|---|---|---|---|
| Pulse Duration | 60-200 fs for normal operation and ~10 fs for special low charge mode | |||
| Photons per Pulse | 1 x 1013 | |||
| Polarization | Linear in normal operation. Circular polarization with DELTA undulator possible with >1011 photons/pulse. Please contact the beamline scientist for details. | |||
| Self-Seeding | Available between 500-1000 eV, with λ/Δλ > 5000 and pulse energy up to 100 μJ. Please contact the beamline scientist for details. | |||
| Two-Pulse Modes | Possible two-pulse modes are described here. Please contact the beamline scientist for details. | |||
Photon Beam Properties
| Sample Configurations | Pre-Mono Transmission Sample Chamber, white beam | Endstation, white beam | Endstation, mono |
|---|---|---|---|
| Focusing Capability (Kirkpatrick-Baez) | 1 x 1 mm (unfocused at sample) | = 2 x 2 μm | = 2 x 2 μm |
| Energy Range | 280-2000 eV | grating 1 (100 lines/mm): 500-1500 eV |
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| grating 2 (200 lines/mm): 800-2000 eV |
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| Energy Resolution | ~0.1 eV (500 eV) | ~0.5 eV (500 eV) | ~0.1 eV (500 eV) |
| ~0.2 eV (1000 eV) | ~1.0 eV (1000 eV) | ~0.5 eV (1000 eV) | |
| ~0.6 eV (2000 eV) | ~2.0 eV (2000 eV) | ~0.6 eV (2000 eV) | |
| Flux (ph/pulse) @ resolution limit | 1 x 1012 (500 eV) | 1 x 1011 (500 eV) | 1 x 1010 (500 eV) |
| 1 x 1013 (1000 eV) | 1 x 1012 (1000 eV) | 3 x 1012 (1000 eV) | |
| 1 x 1013 (2000 eV) | 1 x 1012 (2000 eV) | 2 x 1012 (2000 eV) | |
Optical Laser Properties
| Sample Configurations | Pre-Mono Transmission Sample Chamber | Endstation |
|---|---|---|
| Laser Power | 20 mJ at 800 nm | 20 mJ at 800 nm |
| 25 mJ at 800 nm (uncompressed) |
25 mJ at 800 nm (uncompressed) | |
| 4-5 mJ at 400 nm |
4-5 mJ at 400 nm
|
|
| 1 mJ at 266 nm | 1 mJ at 266 nm | |
| NA |
~100 μJ at 4-10 microns (~70 μJ for longer wavelengths and ~120 μJ for shorter) |
|
| NA |
~ 50 μJ at 10-17 microns (~ 40 μJ for longer wavelengths and ~ 70 μJ for shorter) |
|
| NA |
~ 15 μJ at 75-1500 microns (4 to 0.2 THz) Using LiNbO3 and DAST we have measured energies up to 30 μJ for 0.6 THz peak field and 5 μJ for 2 THz peak fields, but note these are still being developed. |
|
| Laser Pulse Width | 35-150 fs at 800 nm | 35-150 fs at 800 nm |
| 150 ps at 800 nm (uncompressed) |
150 ps at 800 nm (uncompressed) | |
| 50-100 fs at 400 nm | 50-100 fs at 400 nm | |
|
50-100 fs at 266 nm
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50-100 fs at 266 nm
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| NA | 100-200 fs at 4-10 microns | |
| NA | 100-200 fs at 10-17 microns | |
| NA | ~ 1 ps at 75-1500 microns (4 to 0.2 THz) | |
| Focusing Capability | 1 mm (1/e2) | 50 µm (1/e2) |
Approximate Laser System Pulse Energies with Wavelength
Diagnostics
| Fast Shutter | A fast shutter to quickly turn on or off the beam or to select individual LCLS X-ray pulses. Closes or opens in <8 ms. The fast shutter is up stream of the first experimental position. |
|---|---|
| Alignment Laser | A class II alignment laser beam coaxial with the FEL beam at the Endstation Position, to facilitate the positioning of samples in the FEL beam. |
| Pop-In YAG Screens | Along the instrument exist various pop-in YAG screens to observe the X-ray beam distribution with live video cameras. |
| Spectrometer | Using the transmission sample system with thin samples, the spectrum can be viewed through a sample in transmission on a shot-by-shot basis. |
| Flux Monitor | A thin transmissive film can be inserted before the KB system in situ for relative intensity monitoring. |
| Timing System | The timetool measures the relative arrival times between the X-ray and optical pulses on a shot-to-shot basis and provides <100 fs timing resolution. Available when using the un-attenuated X-ray beam. |
| Gas Detector | The gas detector provides shot to shot measurements of the number of photons in each pulse from 5 μJ to 5 mJ with 4-6% absolute uncertainty. |
SXR Links
SXR Contact Info
William F. Schlotter
SXD Instrument Scientist
(650) 926-4940
wschlott@slac.stanford.edu
Joshua J. Turner
SXD Instrument Scientist
(650) 926-4437
joshuat@slac.stanford.edu
Stefan Moeller
SXD Instrument Scientist
(650) 926-5321
smoeller@slac.stanford.edu
Georgi Dakovski
SXD Instrument Scientist
(650) 926-5703
dakovski@slac.stanford.edu
Alexander H. Reid
SXD Instrument Scientist
(650) 926-7467
alexhmr@slac.stanford.edu
Jeff Aldrich
Area Manager
(650) 926-3895
jaldrich@slac.stanford.edu
Control Room: (650) 926-7455
SXR Hutch: (650) 926-7462
SXR Location
Near Experimental Hall (NEH), Hutch 2
Complete instrument map
