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  1. Home
  2. Instruments
  3. SXR - Soft X-ray Materials Science
  4. …
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  • chemRIXS/qRIXS
    • Science Drivers
    • Experimental Methods
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    • Capabilities
  • CXI - Coherent X-ray Imaging
    • Overview
    • Specifications
    • Schematic
    • Components
    • Standard Configurations
    • Publications
  • MEC - Matter in Extreme Conditions
    • Overview
    • Specifications
    • Schematic
    • Components
    • Laser Systems
    • Standard Configurations
    • Publications
  • MFX - Macromolecular Femtosecond Crystallography
    • Overview
    • Specifications
    • Standard Configurations
    • Publications
  • TMO - Time-resolved AMO
    • Science Drivers
    • Early Science
    • Layout & Specifications
    • Standard Configuration
  • TXI - Tender X-ray Instrument
    • Science Drivers
    • Experimental Methods
    • Layout
    • Specifications
  • XCS - X-ray Correlation Spectroscopy
    • Overview
    • Operation Modes
    • Specifications
    • Schematic
    • Components
    • Standard Configurations
    • Publications
  • XPP - X-ray Pump Probe
    • Overview
    • Specifications
    • Schematic
    • Components
    • Standard Configurations
    • Publications
    • User Wiki
  • SLAC MeV-UED
    • Specifications
    • Run 4 Scientific Capabilities
    • Schematics
    • Endstations
    • Proposals
    • Proposal Review Process
    • Schedule
    • Publications
  • LCLS-II-HE Instruments
  • CXI Upgrade
  • MFX Upgrade
  • DXS – Dynamic X-ray Scattering
    • Science Drivers
    • Experimental Methods
    • Layout
    • Specifications
    • Events & News
  • XPP Upgrade
  • Instrument Maps
  • Standard Configurations

SXR Specifications

SXR Scientific Capabilities

Scientific Application

Time-resolved spectroscopy and scattering with ultrafast and ultraintense soft X-rays at the LCLS

Techniques

X-ray Emission Spectroscopy (XES)

X-ray Photoelectron Spectroscopy (XPS)

X-ray Absorption Spectroscopy (XAS)

Coherent Imaging and Fourier Transform Holography​

Reflectivity via Pump-Probe techniques

Diffraction

Resonant Inelastic X-ray Scattering (RIXS)

Sample Environment

A wide range of experimental setups in UHV and HV conditions including liquid or highly ionized plasmas

Source Parameters

Repetition Rate

1 Hz, 10 Hz, 30 Hz, 60 Hz and 120 Hz, Burst Mode or Single Shot

Pulse Duration

60-200 fs for normal operation and ~10 fs for special low charge mode

Photons per Pulse

1 x 1013

​Polarization

​Linear in normal operation. Circular polarization with DELTA undulator possible with >1011 photons/pulse. Please contact the beamline scientist for details.

​Self-Seeding

​Available between 500-1000 eV, with λ/Δλ > 5000 and pulse energy up to 100 μJ. Please contact the beamline scientist for details.

​Two-Pulse Modes

​Possible two-pulse modes are described here. Please contact the beamline scientist for details.

Photon Beam Properties

Sample Configurations

Pre-Mono Transmission 
Sample Chamber, white beam

Endstation, white beam

Endstation, mono

Focusing Capability (Kirkpatrick-Baez)

1 x 1 mm (unfocused at sample)

= 2 x 2 μm

= 2 x 2 μm

Energy Range

280-2000 eV

grating 1 
(100 lines/mm):
500-1500 eV

grating 2 
(200 lines/mm):
800-2000 eV

Energy Resolution

~0.1 eV (500 eV)

~0.5 eV (500 eV)

~0.1 eV (500 eV)

~0.2 eV (1000 eV)

~1.0 eV (1000 eV)

~0.5 eV (1000 eV)

~0.6 eV (2000 eV)

~2.0 eV (2000 eV)

~0.6 eV (2000 eV)

Flux (ph/pulse) @ resolution limit

1 x 1012 (500 eV)

1 x 1011 (500 eV)

1 x 1010 (500 eV)

1 x 1013 (1000 eV)

1 x 1012 (1000 eV)

3 x 1012 (1000 eV)

1 x 1013 (2000 eV)

1 x 1012 (2000 eV)

2 x 1012 (2000 eV)

Optical Laser Properties

Sample Configurations

Pre-Mono Transmission 
Sample Chamber

Endstation

Laser Power

20 mJ at 800 nm

20 mJ at 800 nm

25 mJ at 800 nm 
(uncompressed)

25 mJ at 800 nm (uncompressed)

4-5 mJ at 400 nm

4-5 mJ at 400 nm

1 mJ at 266 nm

1 mJ at 266 nm

NA

~100 μJ at 4-10 microns

(~70 μJ for longer wavelengths and ~120 μJ for shorter)

NA

~ 50 μJ at 10-17 microns 

(~ 40 μJ for longer wavelengths and ~ 70 μJ for shorter)

NA

~ 15 μJ at 75-1500 microns (4 to 0.2 THz)

Using LiNbO3 and DAST we have measured energies up to 30 μJ for 0.6 THz peak field and 5 μJ for 2 THz peak fields, but note these are still being developed.

Laser Pulse Width

35-150 fs at 800 nm

35-150 fs at 800 nm

150 ps at 800 nm 
(uncompressed)

150 ps at 800 nm (uncompressed)

50-100 fs at 400 nm

50-100 fs at 400 nm

50-100 fs at 266 nm
50-100 fs at 266 nm

NA

100-200 fs at 4-10 microns

NA

100-200 fs at 10-17 microns

NA

~ 1 ps at 75-1500 microns (4 to 0.2 THz)

Focusing Capability

1 mm (1/e2)

50 µm (1/e2)

Approximate Laser System Pulse Energies with Wavelength

Approximate Laser System Pulse Energies with Wavelength

Diagnostics

Fast Shutter

A fast shutter to quickly turn on or off the beam or to select individual LCLS X-ray pulses. Closes or opens in <8 ms. The fast shutter is up stream of the first experimental position.

Alignment Laser

A class II alignment laser beam coaxial with the FEL beam at the Endstation Position, to facilitate the positioning of samples in the FEL beam.

Pop-In YAG Screens

Along the instrument exist various pop-in YAG screens to observe the X-ray beam distribution with live video cameras.

Spectrometer

Using the transmission sample system with thin samples, the spectrum can be viewed through a sample in transmission on a shot-by-shot basis.

Flux Monitor

A thin transmissive film can be inserted before the KB system in situ for relative intensity monitoring.

Timing System

The timetool measures the relative arrival times between the X-ray and optical pulses on a shot-to-shot basis and provides <100 fs timing resolution. Available when using the un-attenuated X-ray beam.

Gas Detector

The gas detector provides shot to shot measurements of the number of photons in each pulse from 5 μJ to 5 mJ with 4-6% absolute uncertainty.

SXR CONTACT INFO

William F. Schlotter

SXD Instrument Scientist
(650) 926-4940
wschlott@slac.stanford.edu

Joshua J. Turner

SXD Instrument Scientist
(650) 926-4437
joshuat@slac.stanford.edu

Stefan Moeller

SXD Instrument Scientist
(650) 926-5321
smoeller@slac.stanford.edu

Georgi Dakovski

SXD Instrument Scientist
(650) 926-5703
dakovski@slac.stanford.edu

Alexander H. Reid

SXD Instrument Scientist
(650) 926-7467
alexhmr@slac.stanford.edu

Jeff Aldrich

Area Manager
(650) 926-3895
jaldrich@slac.stanford.edu

--

Control Room: (650) 926-7455
SXR Hutch: (650) 926-7462

SXR LOCATION

SXR location
Near Experimental Hall (NEH), Hutch 2
Complete LCLS Instrument Map
Complete Instrument Map

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