MFX Specifications
MFX Scientific Capabilities
Scientific Applications | Femtosecond Crystallography |
Time-resolved scattering with hard X-rays | |
Techniques and Scattering Geometry | Macromolecular Crystallography |
Forward scattering on fixed-mounted samples, | |
Small Angle X-ray Scattering | |
Wide Angle X-ray Scattering | |
X-ray Emission Spectroscopy |
Source Parameters
Photon Energy | 5-11 keV for the 1st harmonic* |
Up to 25 keV for 2nd and 3rd harmonic | |
Source Size | 60 x 60 µm2 (HxV) FWHM @ 8.3 keV |
78 x 78 µm2 (HxV) FWHM @ 2 keV | |
Source Divergence | 2 x 2 µrad2 (HxV) FWHM @ 8.3 keV |
~7 x 7 µrad2 (HxV) FWHM @ 2 keV | |
Repetition Rate | 120 , 60, 30, 10 Hz, Single shot mode |
Pulse Duration | 30-100 fs (high charge mode) |
<10 fs (low charge mode) | |
Pulse Energy | 1-4 mJ (high charge mode) |
~ 0.2 mJ (low charge mode) | |
Photons per Pulse | ~1 x 1012 (high charge mode @ 8.3 keV) |
~1 x 1011 (low charge mode @ 8.3 keV) |
* Energies below 5 keV are in principle usable but the beam size at the end station is large leading to poor focusing performance and reduced flux. Also, transmission of the beam into atmospheric pressure leads to significant losses. LCLS-II will extend the energy range up to 20 keV.
Photon Beam Properties
Focusing Capability | Beryllium Lenses in Hutch 4.5 (~1 µm focus) |
|---|---|
Beam Size at Sample (8 keV) | 0.7 x 0.7 µm2 FWHM |
Beam Divergence | ~0.3 x 0.3 mrad2 FWHM |
Energy Range | 5-11 keV (1st harmonic using LCLS-I) |
5-20 keV (1st harmonic using LCLS-II) | |
11-25 keV (2nd and 3rd harmonic using LCLS-I) | |
20-25 keV (2nd and 3rd harmonic using LCLS-II) | |
Energy Resolution ΔE/E | ~0.2% (bandwidth of the LCLS beam) |
Sample Environment and Detector
Sample Environment | Atmospheric pressure |
|---|---|
Fixed sample on grids at room temperature | |
Fixed sample on grids at cryogenic temperature | |
Helium atmosphere | |
Humidity control | |
Sample Injectors | Liquid injectors of various kinds (Rayleigh jet, Gas-Dynamic Virtual Nozzles, High-viscosity extruders, electrospinning jet, piezoelectric droplet-on-demand injectors) Fixed target holders |
Detectors | Jungfrau 16M (120 Hz operation with 4000 x 4000 pixel) ePix10K-2.1M (120 Hz operation, currently unavailable) |
MFX CONTACTS
Leland Gee
MFX Instrument Lead Scientist
(650) 926-3234
lbgee@slac.stanford.edu
Fred Poitevin
Instrument Scientist
(650) 926-5326
fpoitevi@slac.stanford.edu
Sandra Mous
Instrument Scientist
(650) 926-6225
smous@slac.stanford.edu
Andy Aquila
Instrument Scientist
(650) 926-2682
aquila@slac.stanford.edu
Daniel Rosenberg
Instrument Scientist
(650) 926-4740
djr@slac.stanford.edu
James Baxter
Instrument Scientist
(650) 926-5052
jb2717@slac.stanford.edu
Sebastian Dehe
Instrument Scientist
(650) 926-4067
dehe@slac.stanford.edu
Ray Sierra
Instrument Scientist & Sample Delivery
(650) 926-3148
rsierra@slac.stanford.edu
Kelsey Banta
Area Manager
(650) 926-3819
banta@slac.stanford.edu
Meredith Henstridge
Laser Scientist
(650) 926-4001
mhenst@slac.stanford.edu
Mike Glownia
Laser Scientist
(650) 926-5456
jglownia@slac.stanford.edu
Serge Guillet
Mechanical Engineer
(650) 926-4771
sguillet@slac.stanford.edu
Russell Woods
Controls Engineer
rcjwoods@slac.stanford.edu
Stella Lisova
Sample Delivery Engineer
(650) 926-3272
stellal@slac.stanford.edu
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MFX Control Room
(650) 926-1745
MFX Hutch
(650) 926-1845
MFX LOCATION