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Breadcrumb

  1. Home
  2. Instruments
  3. MFX (Macromolecular Femtosecond Crystallography)
  4. …
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MFX Specifications

MFX Scientific Capabilities

Scientific Applications

Femtosecond Crystallography

Time-resolved scattering with hard X-rays

Techniques and Scattering Geometry

Macromolecular Crystallography

Forward scattering on fixed-mounted samples, 
and in liquid jets

Small Angle X-ray Scattering

Wide Angle X-ray Scattering

X-ray Emission Spectroscopy

Source Parameters

Photon Energy

5-11 keV for the 1st harmonic*

Up to 25  keV for 2nd and 3rd harmonic

Source Size

60 x 60 µm2 (HxV) FWHM @ 8.3 keV

78 x 78 µm2 (HxV) FWHM @ 2 keV

Source Divergence

2 x 2 µrad2 (HxV) FWHM @ 8.3 keV

~7 x 7 µrad2 (HxV) FWHM @ 2 keV

Repetition Rate

120 , 60, 30, 10 Hz, Single shot mode

Pulse Duration

30-100 fs (high charge mode)

<10 fs (low charge mode)

Pulse Energy

1-4 mJ  (high charge mode)

~ 0.2 mJ  (low charge mode)

Photons per Pulse

~1 x 1012 (high charge mode @ 8.3 keV)

~1 x 1011 (low charge mode @ 8.3 keV)

 

* Energies below 5 keV are in principle usable but the beam size at the end station is large leading to poor focusing performance and reduced flux. Also, transmission of the beam into atmospheric pressure leads to significant losses. LCLS-II will extend the energy range up to 20 keV.

Photon Beam Properties

Focusing Capability

Beryllium Lenses in Hutch 4.5 (~1 µm focus)

Beam Size at Sample (8 keV) 
(Calculated for perfect optics)

0.7 x 0.7 µm2 FWHM

Beam Divergence 
(Calculated for perfect optics)

~0.3 x 0.3 mrad2 FWHM

Energy Range

5-11 keV (1st harmonic using LCLS-I)

5-20 keV (1st harmonic using LCLS-II)

11-25  keV (2nd and 3rd harmonic using LCLS-I)

20-25  keV (2nd and 3rd harmonic using LCLS-II)

Energy Resolution ΔE/E

~0.2% (bandwidth of the LCLS beam)
No monochromator currently

Sample Environment and Detector

Sample Environment

Atmospheric pressure

Fixed sample on grids at room temperature

Fixed sample on grids at cryogenic temperature

Helium atmosphere

Humidity control

Sample Injectors

Liquid injectors of various kinds (Rayleigh jet, Gas-Dynamic Virtual Nozzles, High-viscosity extruders, electrospinning jet, piezoelectric droplet-on-demand injectors)

Fixed target holders

Detectors

Jungfrau 16M (120 Hz operation with 4000 x 4000 pixel)

ePix10K-2.1M (120 Hz operation, currently unavailable) 

MFX LINKS

MFX factsheet

Download MFX Fact Sheet (PDF)  

News Feature: New MFX Experimental Station at LCLS Sees First X-ray Light

MFX CONTACTS

Leland Gee

MFX Instrument Lead Scientist
(650) 926-3234  
lbgee@slac.stanford.edu

Fred Poitevin

Instrument Scientist  
(650) 926-5326  
fpoitevi@slac.stanford.edu

Sandra Mous

Instrument Scientist  
(650) 926-6225
smous@slac.stanford.edu

Andy Aquila

Instrument Scientist   
(650) 926-2682  
aquila@slac.stanford.edu

Daniel Rosenberg

Instrument Scientist  
(650) 926-4740 
djr@slac.stanford.edu

James Baxter

Instrument Scientist  
(650) 926-5052  
jb2717@slac.stanford.edu

Sebastian Dehe

Instrument Scientist  
(650) 926-4067
dehe@slac.stanford.edu

Ray Sierra

Instrument Scientist  & Sample Delivery
(650) 926-3148  
rsierra@slac.stanford.edu

Kelsey Banta

Area Manager  
(650) 926-3819
banta@slac.stanford.edu

Meredith Henstridge

Laser Scientist
(650) 926-4001
mhenst@slac.stanford.edu

Mike Glownia

Laser Scientist  
(650) 926-5456  
jglownia@slac.stanford.edu

Serge Guillet

Mechanical Engineer
(650) 926-4771
sguillet@slac.stanford.edu

Russell Woods

Controls Engineer
rcjwoods@slac.stanford.edu

Stella Lisova

Sample Delivery Engineer
(650) 926-3272
stellal@slac.stanford.edu

-

MFX Control Room
(650) 926-1745  
MFX Hutch
(650) 926-1845

MFX LOCATION

MFX location in Far Experimental Hall (FEH), Hutch 4.5
Far Experimental Hall (FEH), Hutch 4.5
Complete LCLS Instrument Map
Complete Instrument Map

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