MFX Specifications
Specifications
Instruments
- chemRIXS/qRIXS
- CXI - Coherent X-ray Imaging
- MEC - Matter in Extreme Conditions
- MFX - Macromolecular Femtosecond Crystallography
- TMO - Time-resolved AMO
- TXI - Tender X-ray Instrument
- XCS - X-ray Correlation Spectroscopy
- XPP - X-ray Pump Probe
- SLAC MeV-UED
- LCLS-II-HE Instruments
- CXI Upgrade
- MFX Upgrade
- DXS – Dynamic X-ray Scattering
- XPP Upgrade
- Instrument Maps
- Standard Configurations
MFX Scientific Capabilities
Scientific Applications | Femtosecond Crystallography |
---|---|
Time-resolved scattering with hard X-rays | |
Techniques and Scattering Geometry | Macromolecular Crystallography |
Forward scattering on fixed-mounted samples, and in liquid jets |
|
Small Angle X-ray Scattering | |
Wide Angle X-ray Scattering | |
X-ray Emission Spectroscopy |
Source Parameters
Photon Energy | 5-11 keV for the 1st harmonic* |
---|---|
Up to 25 keV for 2nd and 3rd harmonic | |
Source Size | 60 x 60 µm2 (HxV) FWHM @ 8.3 keV |
78 x 78 µm2 (HxV) FWHM @ 2 keV | |
Source Divergence | 2 x 2 µrad2 (HxV) FWHM @ 8.3 keV |
~7 x 7 µrad2 (HxV) FWHM @ 2 keV | |
Repetition Rate | 120 , 60, 30, 10 Hz, Single shot mode |
Pulse Duration | 30-100 fs (high charge mode) |
<10 fs (low charge mode) | |
Pulse Energy | 1-4 mJ (high charge mode) |
~ 0.2 mJ (low charge mode) | |
Photons per Pulse | ~1 x 1012 (high charge mode @ 8.3 keV) |
~1 x 1011 (low charge mode @ 8.3 keV) |
* Energies below 5 keV are in principle usable but the beam size at the end station is large leading to poor focusing performance and reduced flux. Also, transmission of the beam into atmospheric pressure leads to significant losses. LCLS-II will extend the energy range up to 20 keV.
Photon Beam Properties
Focusing Capability | Beryllium Lenses in Hutch 4.5 (~1 µm focus) |
---|---|
Beam Size at Sample (8 keV) (Calculated for perfect optics) | 0.7 x 0.7 µm2 FWHM |
Beam Divergence (Calculated for perfect optics) | ~0.3 x 0.3 mrad2 FWHM |
Energy Range | 5-11 keV (1st harmonic using LCLS-I) |
5-20 keV (1st harmonic using LCLS-II) | |
11-25 keV (2nd and 3rd harmonic using LCLS-I) | |
20-25 keV (2nd and 3rd harmonic using LCLS-II) | |
Energy Resolution ΔE/E | ~0.2% (bandwidth of the LCLS beam) No monochromator currently |
Sample Environment and Detector
Sample Environment | Atmospheric pressure |
---|---|
Fixed sample on grids at room temperature | |
Fixed sample on grids at cryogenic temperature | |
Helium atmosphere | |
Humidity control | |
Sample Injectors | Liquid Jets of various kinds |
Detectors | TBD |
MFX Links
MFX Links
MFX Contact Info
Alex Batyuk
MFX Instrument Lead Scientist
(650) 926-4957
batyuk@slac.stanford.edu
Leland Gee
Scientist
(650) 926-3234
lbgee@slac.stanford.edu
Roberto Alonso-Mori
Scientist
(650) 926-4179
robertoa@slac.stanford.edu
Andy Aquila
Scientist
(650) 926-2682
aquila@slac.stanford.edu
Mark Hunter
Scientist
(650) 926-6294
mhunter2@slac.stanford.edu
Mike Glownia
Laser Scientist
(650) 926-5456
jglownia@slac.stanford.edu
Greg Gate
Laser Scientist
(650) 926-2017
gate@slac.stanford.edu
Matt Hayes
MFX Area Manager
(650) 926-3060
hayes@slac.stanford.edu
Control Room: (650) 926-1745
MFX Hutch: (650) 926-1845