XRT:DIA |
DIAgnostics stand in the X-ray Tunnel |
- Pulse Picker
- Attenuators (10 filters)
- X-ray Focusing Lenses
|
- Rapidly shutter the X-ray beam
- Control the incident beam intensity
- Pre-focus the X-ray beam or produce a ~10 micron focus at CXI
|
DG1 |
DiaGnostics stand 1 |
- Reference Laser
- Slits 1
- Profile-Intensity Monitor
- Differential Pump
|
- Produce a visible reference line for alignment
- Slit the beam down and reduce unwanted halo, Define the beam entering the KB mirrors
- Measure the incidnet beam profile entering the CXI hutch
- Separate the vacuum of the KB mirrors from the upstream beamline
|
KB1 |
1 micron KB mirrors |
- Slits 2
- 1 micron KB mirrors
- Slits 3
|
- Slit the beam down and clean the beam before entering the KB mirrors
- Focus the X-ray beam to a ~1 micron spot
- Slit the beam down and clean the beam entering the KB01 mirrors or the beam exiting the KB1 mirrors
|
KB01 or KB2 |
0.1 micron KB mirrors |
|
- Focus the X-ray beam to a ~100 nm spot
|
SC01 or SC2 |
0.1 micron Sample Chamber |
- 100 nm interaction region
|
- Location of the ~100 nm focus
|
DSA |
Detector Stage (A location) |
- Full size CSPAD
- X-ray Focusing Lenses
- Attenuator or beam stop
|
- Forward scattering measurements with the nanofocus chamber
- Refocusing or collimating the 100 nm focus for reuse downstream
- Attenuate the beam passing through the CSPAD hole or block it entirely
|
DG2 |
DiaGnostics stand 2 |
- CSPAD 140K or X-ray Focusing Lenses
- Slits 4
- Intensity-Position Monitor
- Profile-Intensity Monitor
- Differential Pump
|
- Measure the low angle forward scattering from the 100 interaction region
OR
- Change the divergence of the 1 micron KB beam and control the spot size in SC1
- Slit the beam down after the refociusing lenses or clean the beam before after the 1 micron KB mirrors
- Non-destructive relative measurement of the pulse intensity
- Measure the beam profile on the way to the 1 micron focus, after the 100 nm focus or after the refocusing lenses
- Isolate the 1 micron sample chamber environment from the upstream part of the beamline
|
DSB |
Detector Stage (B location) |
OR
- Time Tool
- Pulse Selector
- Attenuators (6 filters)
- Slits 5
- Differential Pump
|
- Back scattering measurements with the 1 micron focus
OR
- Cross-correlate the arrival time of the X-rays and pump lasers
- Rapidly shutter the X-ray beam or control the repetition rate for SC1
- Control the incident beam intensity
- Slit the beam down after the refocusing lenses or clean the beam before after the 1 micron KB mirrors
- Isolate the 1 micron sample chamber environment from the upstream part of the beamline
|
SC1 |
1 micro Sample Chamber |
- 1 micron interaction region
|
- Location of the ~1 micron focus and of the refocused 100 nm beam
|
DSC |
Detector Stage (C location) |
- Full size CSPAD (Front detector for SC1)
- Attenuator or beam stop
Coming Soon
- Pulse Selector for refocused 1 micron beam
- X-ray focusing lenses for refocusing or collimating the 1 micron focus
|
- Forward scattering measurements with the micron focus chamber (High angle detector)
- Attenuate the beam passing through the CSPAD hole or block it entirely
Coming Soon
- Rapidly shutter the X-ray beam or control the repetition rate for SSC
- Refocusing or collimating the 1 micron focus for reuse downstream
|
SSC or SC3 |
Serial Sample Chamber |
- Interaction for refocused 1 micron beam
|
- Location of the refocused 1 micron beam
|
DSD |
Detector Stage (D location) |
- Full size CSPAD (Back detector for SC1)
OR
- Full size CSPAD (Detector for SSC)
- Attenuator or beam stop
|
- Forward scattering measurements with the micron focus chamber (Low angle detector)
OR
- Forward scattering measurements with the refocused beam in SSC
- Attenuate the beam passing through the CSPAD hole or block it entirely
|
DG3 |
DiaGnostics stand 3 |
|
- Measure the single shot X-ray spectrum
|
DG4 |
DiaGnostics stand 4 |
- Intensity-Position Monitor
- Profile-Intensity Monitor
|
- Non-destructive relative measurement of the pulse intensity
- Measure the beam profile at the end of the CXI hutch, after all focusing optics and all interactions with samples or diagnostics
|