• Pulse Picker
• Attenuators (10 filters)
• X-ray Focusing Lenses

• Rapidly shutter the X-ray beam
• Control the incident beam intensity
• Pre-focus the X-ray beam or produce a ~10 micron focus at CXI

• Reference Laser
• Slits 1
• Profile-Intensity Monitor
• Differential Pump

• Produce a visible reference line for alignment
• Slit the beam down and reduce unwanted halo, Define the beam entering the KB mirrors
• Measure the incidnet beam profile entering the CXI hutch
• Separate the vacuum of the KB mirrors from the upstream beamline

• Slits 2
• 1 micron KB mirrors
• Slits 3

• Slit the beam down and clean the beam before entering the KB mirrors
• Focus the X-ray beam to a ~1 micron spot
• Slit the beam down and clean the beam entering the KB01 mirrors or the beam exiting the KB1 mirrors

• 100 nm KB mirrors

• Focus the X-ray beam to a ~100 nm spot

• 100 nm interaction region

• Location of the ~100 nm focus

• Full size CSPAD
• X-ray Focusing Lenses
• Attenuator or beam stop

• Forward scattering measurements with the nanofocus chamber
• Refocusing or collimating the 100 nm focus for reuse downstream
• Attenuate the beam passing through the CSPAD hole or block it entirely

• CSPAD 140K or X-ray Focusing Lenses
• Slits 4
• Intensity-Position Monitor
• Profile-Intensity Monitor
• Differential Pump

• Measure the low angle forward scattering from the 100 interaction region

OR

• Change the divergence of the 1 micron KB beam and control the spot size in SC1
• Slit the beam down after the refociusing lenses or clean the beam before after the 1 micron KB mirrors
• Non-destructive relative measurement of the pulse intensity
• Measure the beam profile on the way to the 1 micron focus, after the 100 nm focus or after the refocusing lenses
• Isolate the 1 micron sample chamber environment from the upstream part of the beamline

• Full size CSPAD

OR

• Time Tool
• Pulse Selector
• Attenuators (6 filters)
• Slits 5
• Differential Pump

• Back scattering measurements with the 1 micron focus

OR

• Cross-correlate the arrival time of the X-rays and pump lasers
• Rapidly shutter the X-ray beam or control the repetition rate for SC1
• Control the incident beam intensity
• Slit the beam down after the refocusing lenses or clean the beam before after the 1 micron KB mirrors
• Isolate the 1 micron sample chamber environment from the upstream part of the beamline

• 1 micron interaction region

• Location of the ~1 micron focus and of the refocused 100 nm beam

• Full size CSPAD (Front detector for SC1)
• Attenuator or beam stop

Coming Soon

• Pulse Selector for refocused 1 micron beam
• X-ray focusing lenses for refocusing or collimating the 1 micron focus

• Forward scattering measurements with the micron focus chamber (High angle detector)
• Attenuate the beam passing through the CSPAD hole or block it entirely

Coming Soon

• Rapidly shutter the X-ray beam or control the repetition rate for SSC
• Refocusing or collimating the 1 micron focus for reuse downstream

• Interaction for refocused 1 micron beam

• Location of the refocused 1 micron beam

• Full size CSPAD (Back detector for SC1)

OR

• Full size CSPAD (Detector for SSC)
• Attenuator or beam stop

• Forward scattering measurements with the micron focus chamber (Low angle detector)

OR

• Forward scattering measurements with the refocused beam in SSC
• Attenuate the beam passing through the CSPAD hole or block it entirely

• Single Shot Spectrometer

• Measure the single shot X-ray spectrum

• Intensity-Position Monitor
• Profile-Intensity Monitor

• Non-destructive relative measurement of the pulse intensity
• Measure the beam profile at the end of the CXI hutch, after all focusing optics and all interactions with samples or diagnostics