Specifications
Instruments
- chemRIXS/qRIXS
- CXI - Coherent X-ray Imaging
- MEC - Matter in Extreme Conditions
- MFX - Macromolecular Femtosecond Crystallography
- TMO - Time-resolved AMO
- TXI - Tender X-ray Instrument
- XCS - X-ray Correlation Spectroscopy
- XPP - X-ray Pump Probe
- SLAC MeV-UED
- LCLS-II-HE Instruments
- CXI Upgrade
- MFX Upgrade
- DXS – Dynamic X-ray Scattering
- XPP Upgrade
- Instrument Maps
- Standard Configurations
Top Links
LCLS Instruments
TXI, the NEH 1.2 instrument, will be configured to operate on both the soft X-ray undulator (SXU) and the hard X-ray undulator (HXU) sources with the following configuration requirements:
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Fixed X-ray beam trajectories
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Ability to focus the two sources simultaneously into a single micron diameter interaction point where the experimental endstation will be positioned.
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Ability to efficiently change experimental endstations.
X-ray Requirements
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Focusing: KB mirrors with 2 stripes (Nickel and Boron Carbide)
- 1.5 μm in vertical
- 0.8 μm in horizontal
- KB's can be removed for unfocused operation or Zone plate operation
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Photon Energy Range:
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Soft X-ray Undulator Branch Line
- 250 eV to 5 keV
- Harmonic Rejection between 1.4 and 5 keV
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Hard X-ray Branch Line
- 1 keV to 7 keV
- Harmonic Rejection between 2.2 and 7 keV
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Allows both copper and superconducting accelerator operations
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Allows simultaneous undulator operations for X-ray pump and X-ray probe operations
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Beamline transmission 60 to 90% depending on operation mode
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Repetition rate: up to 929 kHz (including 120 Hz Cu operations)
NEH 1.2 Links
TXI Instrument Team
Andy Aquila
Scientist
(650) 926-2682
aquila@slac.stanford.edu
Paul Montanez
Engineer
(650) 926-5461
montanez@slac.stanford.edu