MEC Specifications

Specifications

MEC Source Parameters

Photon Energy 2.5-25 keV for 1st harmonic*
Up to 30 keV for 2nd and 3rd harmonic*
Source Size 60 x 60 µm2 (HxV) FWHM @ 8.3 keV
Source Divergence 2 x 2 µrad2 (HxV) FWHM @ 8.3 keV
Repetition Rate 120 Hz
Pulse Duration 60 - 300 fs (high charge mode)
<10 fs (low charge mode)
Pulse Energy 1-3 mJ (high charge mode)
~ 0.2 mJ (low charge mode)
Photons per Pulse ~1 x 1012 (high charge mode @ 8.3 keV)
~1 x 1011 (low charge mode @ 8.3 keV)

* Energies below 4 keV are in principle usable but the beam size at the end station is large leading to reduced flux. Energies in fundamental above 12 keV and in harmonics above 25 keV will not be available at the start of Run 18 but are expected to be available later in the run. 

Photon Beam Properties

Focusing Capability A selection of compound refractive lenses can be inserted in the beam to provide focusing at a given energy. By locating the sample at or out of focus, the beam size at the sample can be tuned from a couple of microns to several tens of microns.
Unfocused Beam Size (8 keV) Up to 1,000 x 1,000 µm2 FWHM @ 8.3 keV
Energy Range 2.5-12 keV (1st harmonic)*
10-25 keV (2nd and 3rd harmonic)
Energy Resolution ΔE/E ~0.2% (bandwidth of LCLS beam)
1.4 x 10-4 (with a Si(111) monochromater)
​Beamline Transmission ​Depends on photon energy, 10% (4 keV) - 40% (8 keV)

Long Pulse Laser System

Technology Frequency Doubled Nd:Glass system
Wavelength 527 nm (1054 nm in principle available)
Pulse Length 5 - 35 ns ("best effort" for pulse duration down to 2 ns)
Pulse Energy on Target 4 beams of energy depending on pulse length and shape; 15 J at 527 nm in 10 ns square pulse, contact MEC staff for details
Repetition Rate 7 minutes (3.5 minutes for one beam interleaved; pulse shaping quality may be reduced)
​Focusing Capability
  • Flat top spatial profile: 100, 150, 250, 500 µm diameter spot size with Hybrid Phase Plates
  • Flat top spatial profile: 150, 300, and 600 µm diameter spot size with Continuous Phase Plates
  • Gaussian spatial profile: 250 and 500 mm focal length lenses

Short Pulse Laser System

Technology Ti:Sapphire CPA laser system
Wavelength 800 nm (400 nm also available)
Pulse Length 40 fs
Pulse Energy on Target at 800 nm 1 J (at 5 Hz), 10 mJ (at 120 Hz)
Repetition Rate 5 Hz
​ASE Contrast ​​>108
​Focusing Capability ​dependent on the Parabola in use

More Laser Details »

Diagnostics

X-ray Thomson Scattering 
Spectrometers
  • Energy range: 4-8 keV
  • Crystals: HAPG @ ~30 eV, HOPG @ ~9 eV resolution
  • Resolution : 4 x 10-3 at 8 keV for HAPG crystal
  • Scattering angles: 15 - 90 degrees or fixed
  • DAQ rate: 1 or 120 Hz
​CSPAD (Cornell-SLAC
Pixel Array Detector)
detectors
  • 2-Dimensional pixel array detectors, 110 x 110 µm2 pixel size
  • Single photon sensitivity, 103 dynamic range at 8.3 keV
  • 120 Hz operation
  • CSPAD 140K (380 x 380 pixels)
  • Quad CSPAD (758 x 758 pixels)
XUV spectrometer
  • Wavelength range: 7 - 35 nm
  • Resolution: 0.08 nm
  • Collection efficiency: 2.5 10-5 photons 
  • detected per emitted photon in 4π
  • DAQ rate: up to 10 Hz
​Line imaging VISAR
  • Temporal window: 1 ns - 1 ms
  • Temporal resolution: 20 ps
  • Field of view: 0.5-1 mm
  • Imaging resolution: 10 µm
  • 0.1 Hz
FDI
  • Time resolution: 40 fs
  • Spatial resolution: 10 µm
  • Chirped operation possible
  • DAQ rate: up to 10 Hz
Alignment diagnostics
  • Questar long distance microscope
  • Spatial resolution: 20 µm
  • Field of view: 0.5-5 mm adjustable
  • Motorized focus